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Jiahao: /* Projects */

2026-04-22T14:01:17Z

Projects

← Older revision		Revision as of 22:01, 22 April 2026
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	==Projects==		==Projects==

	~~===[[Sample Thickness Measurement via Multi-wavelength Laser Interferometry]]===~~

	~~Team Members: Hang Tianyi, Ding Jiahao, Huang He, Zuo Qingyuan~~

	To address the issues of limited measurement range and phase ambiguity inherent in single-wavelength interferometry for high-precision gauge block measurement, we constructs a multi-wavelength laser interferometry system based on the Twyman-Green architecture.Three visible light beams—red (650 nm), yellow (594 nm), and violet (405 nm)—are selected as light sources. By utilizing the method of excess fractions, high-precision measurement of the sample thickness with a nominal length of 2.00 mm is achieved.

	===[[Fluorescence Sensor for Carbon Quantum Dots: Synthesis, Characterization, and Quality Control]]===		===[[Fluorescence Sensor for Carbon Quantum Dots: Synthesis, Characterization, and Quality Control]]===
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	This project aims to develop a low-cost, repeatable optical sensing system to quantify the quality of Carbon Quantum Dots (CQDs). We synthesize CQDs using a microwave-assisted method with citric acid and urea, and characterize their fluorescence properties using a custom-built setup comprising a UV LED excitation source and a fiber-optic spectrometer. By analyzing spectral metrics such as peak wavelength, intensity, and FWHM, we establish a robust quality control protocol for nanomaterial production.		This project aims to develop a low-cost, repeatable optical sensing system to quantify the quality of Carbon Quantum Dots (CQDs). We synthesize CQDs using a microwave-assisted method with citric acid and urea, and characterize their fluorescence properties using a custom-built setup comprising a UV LED excitation source and a fiber-optic spectrometer. By analyzing spectral metrics such as peak wavelength, intensity, and FWHM, we establish a robust quality control protocol for nanomaterial production.

			===[[Sample Thickness Measurement via Multi-wavelength Laser Interferometry]]===

			Team Members: Hang Tianyi, Ding Jiahao, Huang He, Zuo Qingyuan

			To address the issues of limited measurement range and phase ambiguity inherent in single-wavelength interferometry for high-precision gauge block measurement, we constructs a multi-wavelength laser interferometry system based on the Twyman-Green architecture.Three visible light beams—red (650 nm), yellow (594 nm), and violet (405 nm)—are selected as light sources. By utilizing the method of excess fractions, high-precision measurement of the sample thickness with a nominal length of 2.00 mm is achieved.

	===[[Inductive Sensors of Ultra-high Sensitivity Based on Nonlinear Exceptional Point]]===		===[[Inductive Sensors of Ultra-high Sensitivity Based on Nonlinear Exceptional Point]]===

Tiamyi: /* Sample Thickness Measurement via Multi-wavelength Laser Interferometry */

2026-04-22T10:44:06Z

Sample Thickness Measurement via Multi-wavelength Laser Interferometry

← Older revision		Revision as of 18:44, 22 April 2026
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	Team Members: Hang Tianyi, Ding Jiahao, Huang He, Zuo Qingyuan		Team Members: Hang Tianyi, Ding Jiahao, Huang He, Zuo Qingyuan

	To address the issues of limited measurement range and phase ambiguity inherent in single-wavelength interferometry for high-precision gauge block measurement, we constructs a multi-wavelength laser interferometry system based on the Twyman-Green architecture.Three visible light beams—red (650 nm), yellow (594 nm), and violet (405 nm)—are selected as light sources. By utilizing the method of excess fractions, high-precision measurement of ~~a gauge block~~ with a nominal length of 2.00 mm is achieved.		To address the issues of limited measurement range and phase ambiguity inherent in single-wavelength interferometry for high-precision gauge block measurement, we constructs a multi-wavelength laser interferometry system based on the Twyman-Green architecture.Three visible light beams—red (650 nm), yellow (594 nm), and violet (405 nm)—are selected as light sources. By utilizing the method of excess fractions, high-precision measurement of the sample thickness with a nominal length of 2.00 mm is achieved.

	===[[Fluorescence Sensor for Carbon Quantum Dots: Synthesis, Characterization, and Quality Control]]===		===[[Fluorescence Sensor for Carbon Quantum Dots: Synthesis, Characterization, and Quality Control]]===

Jiahao: /* Laser Interferometric Measurement of Gauge Block Height Based on the Method of Exact Fractions */

2026-04-22T10:02:04Z

Laser Interferometric Measurement of Gauge Block Height Based on the Method of Exact Fractions

← Older revision		Revision as of 18:02, 22 April 2026
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	==Projects==		==Projects==

	===[[Laser ~~Interferometric Measurement of Gauge Block Height Based on the Method of Exact Fractions~~]]===		===[[Sample Thickness Measurement via Multi-wavelength Laser Interferometry]]===

	Team Members: Hang Tianyi, Ding Jiahao, Huang He, Zuo Qingyuan		Team Members: Hang Tianyi, Ding Jiahao, Huang He, Zuo Qingyuan

Tiamyi: /* Projects */

2026-04-22T09:38:48Z

Projects

← Older revision		Revision as of 17:38, 22 April 2026
Line 10:		Line 10:
	==Projects==		==Projects==

	===[[~~Fluorescence Sensor for Carbon Quantum Dots: Synthesis, Characterization, and Quality Control~~]]===		===[[Laser Interferometric Measurement of Gauge Block Height Based on the Method of Exact Fractions]]===

	Team Members: Hang Tianyi, Ding Jiahao, Huang He, Zuo Qingyuan		Team Members: Hang Tianyi, Ding Jiahao, Huang He, Zuo Qingyuan

Tiamyi: /* Projects */ Laser Interferometric Measurement of Gauge Block Height Based on the Method of Exact Fractions

2026-04-22T09:38:21Z

Projects: Laser Interferometric Measurement of Gauge Block Height Based on the Method of Exact Fractions

← Older revision		Revision as of 17:38, 22 April 2026
Line 9:		Line 9:

	==Projects==		==Projects==

			===[[Fluorescence Sensor for Carbon Quantum Dots: Synthesis, Characterization, and Quality Control]]===

			Team Members: Hang Tianyi, Ding Jiahao, Huang He, Zuo Qingyuan

			To address the issues of limited measurement range and phase ambiguity inherent in single-wavelength interferometry for high-precision gauge block measurement, we constructs a multi-wavelength laser interferometry system based on the Twyman-Green architecture.Three visible light beams—red (650 nm), yellow (594 nm), and violet (405 nm)—are selected as light sources. By utilizing the method of excess fractions, high-precision measurement of a gauge block with a nominal length of 2.00 mm is achieved.

	===[[Fluorescence Sensor for Carbon Quantum Dots: Synthesis, Characterization, and Quality Control]]===		===[[Fluorescence Sensor for Carbon Quantum Dots: Synthesis, Characterization, and Quality Control]]===

Junxiang: /* Optical Sensing of Magnetic Dynamics: A Lock-in Detected Single-Spot MOKE Magnetometer */

2026-04-21T16:59:49Z

Optical Sensing of Magnetic Dynamics: A Lock-in Detected Single-Spot MOKE Magnetometer

← Older revision		Revision as of 00:59, 22 April 2026
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	We will use EA spectroscopy, which will include optical sensors, electrical sensors, and lock-in amplifiers, among other components as a highly sensitive, non-destructive optical sensing platform to measure the internal electric field modulation response of organic diodes under operating conditions, and to quantitatively extract carrier mobility based on this measurement. By systematically controlling the thin film preparation temperature and comparing the EA response characteristics of different samples, the project aims to reveal the influence of film preparation temperature on device mobility and its potential physical origins.		We will use EA spectroscopy, which will include optical sensors, electrical sensors, and lock-in amplifiers, among other components as a highly sensitive, non-destructive optical sensing platform to measure the internal electric field modulation response of organic diodes under operating conditions, and to quantitatively extract carrier mobility based on this measurement. By systematically controlling the thin film preparation temperature and comparing the EA response characteristics of different samples, the project aims to reveal the influence of film preparation temperature on device mobility and its potential physical origins.

	===[[Optical Sensing of Magnetic Dynamics: A Lock-in Detected Single-Spot MOKE Magnetometer]]===		===[[Optical Sensing of Magnetic Dynamics: A Lock-in Detected Single Spot MOKE Magnetometer]]===
	Team members: LI Junxiang; Patricia Breanne Tan Sy		Team members: LI Junxiang; Patricia Breanne Tan Sy

Junxiang: /* Projects */

2026-04-21T16:59:25Z

Projects

← Older revision		Revision as of 00:59, 22 April 2026
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	We will use EA spectroscopy, which will include optical sensors, electrical sensors, and lock-in amplifiers, among other components as a highly sensitive, non-destructive optical sensing platform to measure the internal electric field modulation response of organic diodes under operating conditions, and to quantitatively extract carrier mobility based on this measurement. By systematically controlling the thin film preparation temperature and comparing the EA response characteristics of different samples, the project aims to reveal the influence of film preparation temperature on device mobility and its potential physical origins.		We will use EA spectroscopy, which will include optical sensors, electrical sensors, and lock-in amplifiers, among other components as a highly sensitive, non-destructive optical sensing platform to measure the internal electric field modulation response of organic diodes under operating conditions, and to quantitatively extract carrier mobility based on this measurement. By systematically controlling the thin film preparation temperature and comparing the EA response characteristics of different samples, the project aims to reveal the influence of film preparation temperature on device mobility and its potential physical origins.

	===[[Optical ~~Sensor~~ of Magnetic Dynamics: A ~~Balanced~~-~~Detection~~ MOKE Magnetometer]]===		===[[Optical Sensing of Magnetic Dynamics: A Lock-in Detected Single-Spot MOKE Magnetometer]]===
	Team members: LI Junxiang; Patricia Breanne Tan Sy		Team members: LI Junxiang; Patricia Breanne Tan Sy

Sree: Undo revision 1051 by Sree (talk)

2026-04-21T04:01:50Z

Undo revision 1051 by Sree (talk)

← Older revision		Revision as of 12:01, 21 April 2026
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	We will be constructing an interferometer and use it as a tool for precision measurement. One primary objective is determination of the refractive index of solution of different salt concentration by analyzing the resulting shift interference fringes.		We will be constructing an interferometer and use it as a tool for precision measurement. One primary objective is determination of the refractive index of solution of different salt concentration by analyzing the resulting shift interference fringes.

	===[[~~Seebeck Coefficient~~ Measurement ~~of Undoped ZnO Pellet Using a Two-Probe Thermoelectric Characterisation Setup~~]]===		===[[Precision Thermocouple Based Temperature Measurement System]]===
	Team members: Sree Ranjani Krishnan; Nisha Ganesh ; Burra Srikari		Team members: Sree Ranjani Krishnan; Nisha Ganesh ; Burra Srikari

Sree: /* Projects */

2026-04-21T04:01:32Z

Projects

← Older revision		Revision as of 12:01, 21 April 2026
Line 42:		Line 42:
	We will be constructing an interferometer and use it as a tool for precision measurement. One primary objective is determination of the refractive index of solution of different salt concentration by analyzing the resulting shift interference fringes.		We will be constructing an interferometer and use it as a tool for precision measurement. One primary objective is determination of the refractive index of solution of different salt concentration by analyzing the resulting shift interference fringes.

	===[[~~Precision Thermocouple Based Temperature~~ Measurement ~~System~~]]===		===[[Seebeck Coefficient Measurement of Undoped ZnO Pellet Using a Two-Probe Thermoelectric Characterisation Setup]]===
	Team members: Sree Ranjani Krishnan; Nisha Ganesh ; Burra Srikari		Team members: Sree Ranjani Krishnan; Nisha Ganesh ; Burra Srikari

Sree: Undo revision 1049 by Sree (talk)

2026-04-21T04:00:28Z

Undo revision 1049 by Sree (talk)

← Older revision		Revision as of 12:00, 21 April 2026
Line 42:		Line 42:
	We will be constructing an interferometer and use it as a tool for precision measurement. One primary objective is determination of the refractive index of solution of different salt concentration by analyzing the resulting shift interference fringes.		We will be constructing an interferometer and use it as a tool for precision measurement. One primary objective is determination of the refractive index of solution of different salt concentration by analyzing the resulting shift interference fringes.

	===[[~~Experimental Investigation of the Thermoelectric Properties of an Undoped ZnO Pellet at Room~~ Temperature]]===		===[[Precision Thermocouple Based Temperature Measurement System]]===
	Team members: Sree Ranjani Krishnan; Nisha Ganesh ; Burra Srikari		Team members: Sree Ranjani Krishnan; Nisha Ganesh ; Burra Srikari