Sample Thickness Measurement via Multi-wavelength Laser Interferometry - Revision history

Tiamyi: /* Experimental Details */

2026-04-23T13:39:55Z

Experimental Details

← Older revision		Revision as of 21:39, 23 April 2026
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	Since the sensitive area of the CCD is much smaller than the actual interference pattern, a beam-converging (imaging) system is incorporated into the optical path to ensure that the interference pattern can be captured more completely.		Since the sensitive area of the CCD is much smaller than the actual interference pattern, a beam-converging (imaging) system is incorporated into the optical path to ensure that the interference pattern can be captured more completely.

	[[File:~~Exposit~~.jpeg\|1200px\|center]]		[[File:Treeset.jpeg\|1200px\|center]]

	===Data Preprocessing===		===Data Preprocessing===

Jiahao: /* Data Preprocessing */

2026-04-23T13:39:43Z

Data Preprocessing

← Older revision		Revision as of 21:39, 23 April 2026
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	[[File:PARA.png\|1000px\|center]]		[[File:PARA.png\|1000px\|center]]

	The thickness of the sample, as measured with a vernier caliper, was between <math>2.00</math> and <math>2.02\ \text{mm}</math>.		The thickness of the sample, as measured with a vernier caliper, was between <math>1.98</math> and <math>2.02\ \text{mm}</math>.

	[[File:Rulerfig.jpeg\|300px\|center]]		[[File:Rulerfig.jpeg\|300px\|center]]

Jiahao: /* Data Preprocessing */

2026-04-23T13:39:06Z

Data Preprocessing

← Older revision		Revision as of 21:39, 23 April 2026
Line 128:		Line 128:
	[[File:PARA.png\|1000px\|center]]		[[File:PARA.png\|1000px\|center]]

	The thickness of the sample, as measured with a vernier caliper, was between <math>1.98</math> and <math>2.02\ \text{mm}</math>.		The thickness of the sample, as measured with a vernier caliper, was between <math>2.00</math> and <math>2.02\ \text{mm}</math>.

	[[File:Rulerfig.jpeg\|300px\|center]]		[[File:Rulerfig.jpeg\|300px\|center]]

Jiahao: /* Team Members */

2026-04-23T13:25:29Z

Team Members

← Older revision		Revision as of 21:25, 23 April 2026
Line 5:		Line 5:

	Zuo Qingyuan A0326644B		Zuo Qingyuan A0326644B

			Huang He A0326669M

	==Introduction==		==Introduction==

Qingyuan: /* Team Members */

2026-04-23T06:12:33Z

Team Members

← Older revision		Revision as of 14:12, 23 April 2026
Line 3:		Line 3:

	Ding Jiahao A0332300A		Ding Jiahao A0332300A

	Zuo Qingyuan A0326644B		Zuo Qingyuan A0326644B

Qingyuan: /* Team Members */

2026-04-23T06:12:21Z

Team Members

← Older revision		Revision as of 14:12, 23 April 2026
Line 3:		Line 3:

	Ding Jiahao A0332300A		Ding Jiahao A0332300A


	Zuo Qingyuan A0326644B		Zuo Qingyuan A0326644B

Qingyuan: /* Team Members */

2026-04-23T06:12:07Z

Team Members

← Older revision		Revision as of 14:12, 23 April 2026
Line 3:		Line 3:

	Ding Jiahao A0332300A		Ding Jiahao A0332300A


			Zuo Qingyuan A0326644B

	==Introduction==		==Introduction==

Jiahao: /* Introduction */

2026-04-23T04:37:47Z

Introduction

← Older revision		Revision as of 12:37, 23 April 2026
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	Although this theory is well-established, practical applications are significantly influenced by wavelength stability, the precision of fractional part extraction, and fluctuations in the refractive index of air. Studies by Birch, Downs, and others on the revision of the Edlén formula underscore that precise environmental compensation is a prerequisite for interferometric accuracy. Furthermore, fringe quality (such as width and contrast) and the noise immunity of fractional extraction algorithms are critical factors in ensuring the robustness of the measurement system.		Although this theory is well-established, practical applications are significantly influenced by wavelength stability, the precision of fractional part extraction, and fluctuations in the refractive index of air. Studies by Birch, Downs, and others on the revision of the Edlén formula underscore that precise environmental compensation is a prerequisite for interferometric accuracy. Furthermore, fringe quality (such as width and contrast) and the noise immunity of fractional extraction algorithms are critical factors in ensuring the robustness of the measurement system.

			==Objectives==

	To address the aforementioned challenges, a high-precision multi-wavelength interferometry system based on the Twyman-Green configuration was developed. Three visible laser sources—red (650 nm), yellow (594 nm), and violet (405 nm)—were employed in the experimental setup. A block with a length of 2.00 mm (pre-measured by a vernier caliper) served as the measurement specimen. To mitigate wavelength fluctuations induced by environmental variables, the updated Edlén formula was implemented to provide precise compensation for the refractive index of air.		To address the aforementioned challenges, a high-precision multi-wavelength interferometry system based on the Twyman-Green configuration was developed. Three visible laser sources—red (650 nm), yellow (594 nm), and violet (405 nm)—were employed in the experimental setup. A block with a length of 2.00 mm (pre-measured by a vernier caliper) served as the measurement specimen. To mitigate wavelength fluctuations induced by environmental variables, the updated Edlén formula was implemented to provide precise compensation for the refractive index of air.

Jiahao: /* Introduction */

2026-04-23T04:36:42Z

Introduction

← Older revision		Revision as of 12:36, 23 April 2026
Line 11:		Line 11:
	Although this theory is well-established, practical applications are significantly influenced by wavelength stability, the precision of fractional part extraction, and fluctuations in the refractive index of air. Studies by Birch, Downs, and others on the revision of the Edlén formula underscore that precise environmental compensation is a prerequisite for interferometric accuracy. Furthermore, fringe quality (such as width and contrast) and the noise immunity of fractional extraction algorithms are critical factors in ensuring the robustness of the measurement system.		Although this theory is well-established, practical applications are significantly influenced by wavelength stability, the precision of fractional part extraction, and fluctuations in the refractive index of air. Studies by Birch, Downs, and others on the revision of the Edlén formula underscore that precise environmental compensation is a prerequisite for interferometric accuracy. Furthermore, fringe quality (such as width and contrast) and the noise immunity of fractional extraction algorithms are critical factors in ensuring the robustness of the measurement system.

	To address the aforementioned challenges, a high-precision multi-wavelength interferometry system based on the Twyman-Green configuration was developed~~, complemented by an in-depth investigation into robust reconstruction algorithms for complex environments~~. Three visible laser sources—red (650 nm), yellow (594 nm), and violet (405 nm)—were employed in the experimental setup. A block with a length of 2.00 mm (pre-measured by a vernier caliper) served as the measurement specimen. To mitigate wavelength fluctuations induced by environmental variables, the updated Edlén formula was implemented to provide precise compensation for the refractive index of air.		To address the aforementioned challenges, a high-precision multi-wavelength interferometry system based on the Twyman-Green configuration was developed. Three visible laser sources—red (650 nm), yellow (594 nm), and violet (405 nm)—were employed in the experimental setup. A block with a length of 2.00 mm (pre-measured by a vernier caliper) served as the measurement specimen. To mitigate wavelength fluctuations induced by environmental variables, the updated Edlén formula was implemented to provide precise compensation for the refractive index of air.

	==Basic Principles of the Experiment==		==Basic Principles of the Experiment==

Tiamyi: /* Experimental Setups */

2026-04-23T04:26:54Z

Experimental Setups

← Older revision		Revision as of 12:26, 23 April 2026
Line 114:		Line 114:
	Since the sensitive area of the CCD is much smaller than the actual interference pattern, a beam-converging (imaging) system is incorporated into the optical path to ensure that the interference pattern can be captured more completely.		Since the sensitive area of the CCD is much smaller than the actual interference pattern, a beam-converging (imaging) system is incorporated into the optical path to ensure that the interference pattern can be captured more completely.

	[[File:~~EXP_SETUP~~.jpeg\|~~1000px~~\|center]]		[[File:Exposit.jpeg\|1200px\|center]]

	===Data Preprocessing===		===Data Preprocessing===