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===[[Sample Thickness Measurement via Multi-wavelength Laser Interferometry]]===

Team Members: Hang Tianyi, Ding Jiahao, Huang He, Zuo Qingyuan

To address the issues of limited measurement range and phase ambiguity inherent in single-wavelength interferometry for high-precision gauge block measurement, we constructs a multi-wavelength laser interferometry system based on the Twyman-Green architecture.Three visible light beams—red (650 nm), yellow (594 nm), and violet (405 nm)—are selected as light sources. By utilizing the method of excess fractions, high-precision measurement of the sample thickness with a nominal length of 2.00 mm is achieved.